Highlights

Free standing GaN substratesBulk growthBulk growth
  • Free standing GaN substrates separated from sapphire were used as seeds for HVPE
  • Cystals thicker than 2 mm were deposited in a few subsequent growth runs.
  • Growth rate 20µm/h- 200µm/h

  • Atomically flat m-plane GaN for miscut along [11-26]
  • Analysis of local lattice parameter with world 1.6 pm precision
  • Analysis In content down 2% possible
  • Within 1 year a complete software package for contrast simulation and strain analyis has been developed

For both polarities:

  • Self-surfactant effect operative under In-rich and Ga-rich regimes
  • Structures with In in subsurface layers stable under In-rich, N-rich conditions
  • High nitrogen flux allows to grow high quality InGaN in PAMBE
  • Record for electrically pumped nitride MBE laser diodes at 458 nm.
  • Continuous wave laser-diodes on low dislocation GaN were demonstrated:
    λ = 450 nm, Pmax= 60 mW, t > 5000 h (threading disloction density =1x104 cm-2)

 

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